| Name | Title | Contact Details |
|---|---|---|
Matthew Dawson |
Chief Technology Officer | Profile |
Nova Measuring Instruments Ltd. is a leading provider of advanced, high-throughput metrology solutions for semiconductor manufacturing worldwide. Used by over 80% of the largest integrated-circuit manufacturers, Nova’s solutions deliver the high-volume complex measurements required for effective process control. Nova offers a selection of Integrated and Stand-Alone metrology platforms, which are complimented by the powerful NovaMARS® modeling engine. This flexible offering enables Nova to partner with semiconductor manufacturers throughout the entire product lifecycle; from application development to high-volume production. Featuring a unique combination of Spectroscopic Reflectrometry and Scatterometry, Nova’s metrology solutions measure a wide variety of features and parameters including CD, trench depth, photoresist height, thickness and shape of complex layer stacks. With Nova, you get the tight wafer-to-wafer and within-wafer control necessary to develop and produce advanced 2D/3D structures for high-end semiconductor devices. Founded in 1993, Nova’s headquarters are located in Israel and the company has offices in Taiwan, Korea, Singapore, China, United States, Japan and Europe.
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